发明名称 Unit with inspection probe blocks mounted thereon in parallel
摘要 <p>To provide a unit with inspection block blocks mounted thereon in parallel, wherein a plurality of inspection probe blocks are inserted into and removed from a guide rail through a slider so that the probe blocks can be loaded or replaced. Each probe block is slidingly moved along the guide rail so that its positional adjustment can be made in an extension length of the guide rail. Only one kind of support base can commonly be used by inserting and removing different probe blocks with respect to the support base and the positional adjustment can be done. The unit with inspection probe blocks mounted thereon in parallel comprises a support base 1 and a plurality of inspection probe blocks 3 each having a plurality of blocks 2 and arranged on the support base 1 in parallel, the probes 2 of each inspection probe block 3 being contacted with electrodes 5 of a display panel or wiring circuit board 4 so that inspection can be carried out, wherein a guide rail 7 is disposed on the support base 1, the inspection probe blocks 3 are slidably fitted to the guide rail 7 through a slider 8, and each inspection probe block 3 is fixed to the support base 1 at a predetermined slide position.</p>
申请公布号 EP1209473(A2) 申请公布日期 2002.05.29
申请号 EP20010309391 申请日期 2001.11.06
申请人 SOSHOTECH CO., LTD.;ADTEC ENGINEERING CO., LTD. 发明人 OKUNO, TOSHIO;NAGASHIMA, MASATOMO;OGUMA, ATSUSHI;FURUMI, TADASHI
分类号 G01R1/073;G02F1/13;(IPC1-7):G01R1/073 主分类号 G01R1/073
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