High speed interferential microscopic imaging, uses two-arm interferometer with sinusoidal modulation and computer integrating output interference signal

摘要

The interferential microscopic imaging technique uses a two-wave interferometer, one of the arms (7) containing the object (9) to be analyzed. The phase is subject to a sinusoidal modulation at frequency, f. The interference signal (S) is integrated by a multi-channel sensor (15) and a computer (19) records the integrated interference signal. The interferential microscopic imaging technique consists of sending a light beam along each of the arms of a two-wave interferometer, one of the arms (7) containing the object (9) to be analyzed. The phase is subject to a sinusoidal modulation at frequency, f. The signal modulation results from mechanical oscillation of an assembly of elements (16) of the interferometer. The interference signal (S) is integrated during the variation phase by means of a multi-channel sensor (15). A computer (19) records the integrated interference signal obtained during each fraction of a period (1/n), subsequently calculating the image of the object (9).