发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method and apparatus for manufacturing a high-quality thin film on a substrate by continuously producing a homegeneous plasma under a pressure being very close to the atmospheric pressure and then treating the substrate with the plasma, in the manufacture of a metal thin film or metal silicide film in a semiconductor device manufacturing process. SOLUTION: In forming the metal thin film or metal silicide thin film in the semiconductor device by the plasma CVD method, a solid-state dielectric is provided on at least one opposite face of a pair of opposite electrodes under a pressure being very close to the atmospheric pressure, and a processing gas is introduced between the opposite electrodes to apply a pulsatory electric field to the electrodes to generate a plasma. The plasma is brought into contact with the substrate. A part near the contact section between the plasma and the substrate is kept in an atmosphere of at least one kind of element selected among argon, helium, neon, and xenon.
申请公布号 JP2002151436(A) 申请公布日期 2002.05.24
申请号 JP20000348737 申请日期 2000.11.15
申请人 SEKISUI CHEM CO LTD;CHEMITORONICS CO LTD 发明人 SHIMONISHI KOJI;YUASA MOTOKAZU;HONMA KOJI
分类号 C23C16/455;H01L21/285;(IPC1-7):H01L21/285 主分类号 C23C16/455
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