发明名称 APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce particles deposited onto a substrate being processed in the micromachining process or film deposition process. SOLUTION: Forward end part of piping for supplying gas into a carrying chamber is coated with a corrosion resistant material. Alternatively, a nozzle made of a corrosion resistant material is fixed to the forward end part of a nozzle in order to prevent corrosion of a material composing the carrying chamber thus suppressing generation of particles. Since contamination is reduced on the substrate, trouble is reduced in the film deposition process and micromachining process. Consequently, the yield of manufacture is increased while reducing the production cost of semiconductor device.
申请公布号 JP2002151474(A) 申请公布日期 2002.05.24
申请号 JP20000345463 申请日期 2000.11.08
申请人 HITACHI LTD 发明人 YAMANE MIYUKI;KAWADA HIROKI;TAKAHASHI OSAMU
分类号 C23C16/44;H01L21/205;H01L21/302;H01L21/3065;H01L21/677;H01L21/68;(IPC1-7):H01L21/306 主分类号 C23C16/44
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