发明名称 CIRCUIT DEVICE OF LOW INDUCTANCE
摘要 PROBLEM TO BE SOLVED: To optimize a total inductance to 1 nH or below in the region of a connection line as well as in the region of a semiconductor device configured on an electrically insulated substrate, related to a parasitic inductance of a circuit device. SOLUTION: A first power transistor (13) and a second power transistor (19) are arrayed in a line while adjoining each other with a narrow gap. DC connection conductors adjoin each other, as a band, with a narrow gap at a first part while parallel to each other up to near a substrate surface (9) or contact it. At least one DC connection conductor is parallel to the substrate surface while comprising a second band part disposing a bar (23). These bars are partially separated from the substrate only by an insulating layer, with at least one contact position (12) to the substrate surface comprised.
申请公布号 JP2002151691(A) 申请公布日期 2002.05.24
申请号 JP20010226095 申请日期 2001.07.26
申请人 SEMIKRON ELEKTRON GMBH 发明人 MOURICK PAUL
分类号 H01L29/78;H01L25/07;H01L27/04;H02M7/00 主分类号 H01L29/78
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