ALWAYS ENABLED TEST METHOD FOR MONOLITHIC INTEGRATED CIRCUIT DEVICE, AND INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an on-chip test interface being integrated and always enabled which is used for verifying a function of high speed incorporated memory such as a synchronous dynamic random access memory(SDRAM) enabling performing a test with an existing tester having comparatively low operation speed (therefore, low cost), or the like. SOLUTION: An interface enables verifying of incorporating memory-macro design using a test interface, the test interface enables that an input signal from a tester of a half rate and a narrow word performs all memory macro- operation over width of a wide memory-macro input/output architecture (I/O) by comprising an on-chip test circuit being separated from a memory-macro. The on-chip test circuit also can comprise a synchronizing circuit for minimizing the skew between an external clock and data outputted from the test chip.