发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus capable of shortening the carrying time of a substrate, improving the processing efficiency of the substrate, and suppressing thermal interference between units as much as possible. SOLUTION: A wafer W is carried among the unit of an applying processing system, the unit of a heating processing system and the unit of a cooling processing system or the like further by sheets by using first and second main carrying bodies 22 and 23. The plural kinds of heating processings are executed to the wafer W by a multifunctional hot plate curing device (MTC).
申请公布号 JP2002151485(A) 申请公布日期 2002.05.24
申请号 JP20000346645 申请日期 2000.11.14
申请人 TOKYO ELECTRON LTD 发明人 SAKAI KOJI;KAWAZU TOMOKI;OTANI HIBIKI
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
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