METHOD AND DEVICE FOR MEASURING PROPERTIES OF A SAMPLE

摘要

The invention relates to a method and devices for measuring at least one property of a sample (10). One aim of the invention is to reduce the measuring time of one such method. To this end, individual parameters of the sample (10) are changed in a targeted manner and at least one modulatable measuring signal (20, 20A, 20B) is produced, said signals respectively containing a measurand which is to be determined and which is dependant on at least one parameter of the sample (10). The measuring signals (20, 20A, 20B) are detected for the production of detector signals (30) and the measurands are determined on the basis of the detector signals (30) produced in this way. Before the detection process, the measuring signals (20, 20A, 20B) are subjected to a modulation with determined modulation parameters. The modulated measuring signals (20, 20A, 20B) are then temporally integrated and information relating to the measurands is determined on the basis of the detector signals (30) and the parameters of the modulation of the modulated measuring signals (20, 20A, 20B).