发明名称 |
Echelle spectrometer has setting device adjusting positions of optical components for wavelength calibration of echelle spectra |
摘要 |
The echelle spectrometer (10) has a setting device for setting the positions of the optical components of the spectrometer, for position adjustment of the spectral lines within the output plane (72), containing a surface detector with a 2-dimensional array of image elements, e.g. a CCD detector, for wavelength calibration of the echelle spectra. The setting device can be computer controlled and includes at least one piezoelement supplied with a regulated setting voltage. Also included are Independent claims for the following: (a) a compensation method for shifts in the echelle spectrum in an echelle spectrometer; (b) a method for determining the binning-regions of a surface detector for an echelle spectrometer; (c) a wavelength calibration method for echelle spectra; (d) a method for background detection and wideband background correction
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申请公布号 |
DE10055905(A1) |
申请公布日期 |
2002.05.23 |
申请号 |
DE2000155905 |
申请日期 |
2000.11.13 |
申请人 |
GESELLSCHAFT ZUR FOERDERUNG ANGEWANDTER OPTIK, OPTOELEKTRONIK;GESELLSCHAFT ZUR FOERDERUNG DER SPEKTROCHEMIE UND ANGEWANDTEN SPEKTROSKOPIE E.V. |
发明人 |
FLOREK, STEFAN;OKRUSS, MICHAEL;BECKER-ROS, HELMUT |
分类号 |
G01J3/02;G01J3/06;G01J3/18;G01J3/28;(IPC1-7):G01J3/28 |
主分类号 |
G01J3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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