发明名称 METHOD OF FORMING LIGHTLY DOPED REGIONS IN A SEMICONDUCTOR DEVICE
摘要 A method is disclosed in which a lightly doped region in a semiconductor layer is obtained by diffusing dopant atoms of a first and second type into the underlying semiconductor layer. Preferably, the method is applied to the formation of lightly doped source and drain regions in a field effect transistor so as to obtain a required gradual dopant concentration transition from the general region to the drain and source regions for avoiding the hot carrier effect. Advantageously, a diffusion of the dopant atoms is initiated during an oxidizing step in which the thickness of the gate insulation layer is increased at the edge portions thereof.
申请公布号 US2002061626(A1) 申请公布日期 2002.05.23
申请号 US20010852535 申请日期 2001.05.10
申请人 FEUDEL THOMAS;HORSTMANN MANFRED;WIECZOREK KARSTEN 发明人 FEUDEL THOMAS;HORSTMANN MANFRED;WIECZOREK KARSTEN
分类号 H01L21/225;H01L21/336;H01L29/423;H01L29/78;(IPC1-7):H01L21/336;H01L21/22;H01L21/38;H01L21/320;H01L21/476 主分类号 H01L21/225
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