发明名称 |
Non-volatile semiconductor memory device and fabrication process thereof |
摘要 |
A fabrication process of a non-volatile semiconductor memory device includes the step of forming a plurality of openings in a device isolation structure defining an active region in a memory cell region such that each opening exposes the substrate surface extends from the active region to the outside thereof. Further, silicide regions are formed in the openings by a self-aligned process such that the silicide regions are mutually separated. Further a contact hole is formed in an interlayer insulation film in correspondence to the silicide regions.
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申请公布号 |
US2002060365(A1) |
申请公布日期 |
2002.05.23 |
申请号 |
US20010963632 |
申请日期 |
2001.09.27 |
申请人 |
FUJITSU LIMITED |
发明人 |
TAKAHASHI KOJI;HASHIMOTO HIROSHI |
分类号 |
H01L21/8247;H01L21/8246;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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