发明名称 INSPECTING APPARATUS AND INSPECTING METHOD FOR CIRCUIT BOARD
摘要 <p>An inspecting apparatus and an inspecting method which enable the high-speed inspection of a circuit board. An LCD driver module (100) that is an inspection object has a mounted PDP-driving LSI (110). A circuit wiring (111) is connected to its terminal. An inspecting apparatus (1) outputs an LSI drive signal to an input terminal (113) of the LSI (110). A sensor (2) is arranged contactlessly at the position opposite to the circuit wiring (111) and senses a voltage value occurring on the circuit wwiring (111) by driving the LSI (110), and the sense signal is analyzed by the inspecting apparatus (1).</p>
申请公布号 WO2002041018(P1) 申请公布日期 2002.05.23
申请号 JP2001009992 申请日期 2001.11.15
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