发明名称 Method for manufacturing a semiconductor thin film
摘要 A little amount of nickel is introduced into an amorphous silicon film formed on a glass substrate to crystallize the amorphous silicon film by heating. In this situation, nickel elements remain in a crystallized silicon film. An amorphous silicon film is formed on the surface of the crystallized silicon film and then subjected to a heat treatment. With this heat treatment, the nickel elements are diffused in the amorphous silicon film, thereby being capable of lowering the concentration of nickel in the crystallized silicon film.
申请公布号 US2002061634(A1) 申请公布日期 2002.05.23
申请号 US20010041844 申请日期 2001.10.24
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD., A JAPANESE CORPORATION 发明人 YAMAZAKI SHUNPEI;OHTANI HISASHI;MIYANAGA AKIHARU;TERAMOTO SATOSHI
分类号 H01L21/20;H01L21/336;(IPC1-7):C30B1/00;H01L21/36 主分类号 H01L21/20
代理机构 代理人
主权项
地址
您可能感兴趣的专利