发明名称 Method of manufacturing a double sided processed integrated circuit forming a contact structure for connecting metallizing structures of each individual chip
摘要 The method of manufacturing a double sided processed integrated chip involves providing, on one side of a silicon wafer with a thickness of around 0.8 mm, a circuit structure. A metalization structure is provided over the circuit structure. A similar circuit structure and metalization structure are provided on the other side of the wafer. The electric insulation of the two circuit structures is provided only by the undoped silicon material of the wafer lying between them. A contacting structure is formed to connect the two metalization layers of each individual chip.
申请公布号 DE10055848(A1) 申请公布日期 2002.05.23
申请号 DE20001055848 申请日期 2000.11.10
申请人 INFINEON TECHNOLOGIES AG 发明人 PFEIFFER, MICHAEL;ANGERMANN, WOLFGANG
分类号 H01L21/02;H01L21/822;(IPC1-7):H01L21/822;H01L21/68;H01L23/50 主分类号 H01L21/02
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