发明名称 INSPECTING APPARATUS AND INSPECTING METHOD FOR CIRCUIT BOARD
摘要 <p>An inspecting apparatus and an inspecting method which enable the high-speed inspection of a circuit board. An LCD driver module (100) that is an inspection object has a mounted LCD-driving LSI (110). A circuit wiring (111) is connected to an SEG terminal, and a circuit wiring (112) to the COM terminal of the LSI (110). An inspecting apparatus (1) outputs an LSI drive signal to an input terminal (113) of the LSI (110). Sensors (2, 3) are arranged contactlessly at the positions opposite to the circuit wirings (111, 112), respectively, and sense a potential change occurring on the circuit wirings (111, 112) by driving the LSI (110), and the sense signal is analyzed by the inspecting apparatus (1).</p>
申请公布号 WO2002041019(P1) 申请公布日期 2002.05.23
申请号 JP2001009993 申请日期 2001.11.15
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