| 摘要 |
A device for optical measuring of small particles for analysis of the quality of the particles comprises a sample-feeding carrier which is adapted to take up particle samples in sample holders and transport the particle samples to a place for optical measurement, a mirror-supporting means which follows the movement of the carrier and has mirrors matching the sample holders, a device for illuminating a particle sample when positioned for optical measurement and a detector, which is sensitive to electromagnetic radiation and records at least one result of an optical measurement of the illuminated particle sample. A mirror of the mirror-supporting means reflects the particle sample, so that a mirror image thereof stands essentially still seen from the detector, when a measurement is being recorded, owing to the fact that the mirror image of the particle sample falls on a center axis of the movement of the mirror-supporting means. A method for optical measuring of small particles uses the device above. The method comprises the steps of feeding particle samples to a place for optical measurement, following the movement of a particle sample with a mirror in such manner that, in the place for optical measurement, a mirror image of the particle sample falls on a center axis of the movement of the mirror, illuminating the particle sample when this is positioned for optical measurement, and recording at least one result of an optical measurement of the illuminated particle sample by means of a detector sensitive to electromagnetic radiation.
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