发明名称 In-situ post epitaxial treatment process
摘要 A process for forming an epitaxial layer on a semiconductor wafer substrate is provided. The process comprises providing a semiconductor wafer substrate and an area for forming an epitaxial layer on said semiconductor wafer substrate. The formation area consists essentially of an epitaxial layer process chamber. The semiconductor wafer substrate is introduced into the epitaxial layer process chamber and an epitaxial layer is formed on at least one surface of the semiconductor wafer substrate. At least one epitaxial layer surface is substantially hydrophobic. Then, a chemical reagent is introduced into said epitaxial layer process chamber. The chemical reagent reacts with the epitaxial layer surface in situ to form an outer layer.
申请公布号 US2002059900(A1) 申请公布日期 2002.05.23
申请号 US20010997139 申请日期 2001.11.28
申请人 DIETZE GERALD R. 发明人 DIETZE GERALD R.
分类号 C30B25/02;C30B33/00;H01L21/205;H01L21/316;H01L21/318;(IPC1-7):C30B25/00;C30B23/00;C30B28/12;C30B28/14 主分类号 C30B25/02
代理机构 代理人
主权项
地址