| 摘要 |
PROBLEM TO BE SOLVED: To provide a multi-port inspection system capable of excellently performing measurement for effective inspection of a multi-port optical device. SOLUTION: This multi-port inspection system is provided with a splitter 208 dividing a scan optical signal into a reference signal and an inspection signal, an inspection system input port 256 transmitting the inspection signal to a multi-port optical device 220, an optical combiner 210 combining a first part of the inspection signal having a first transmission delay and a second part of the inspection signal part having a second transmission delay with the reference signal, a receiver 212 detecting a first heterodyne signal generated from the combined first part of the inspection signal and the reference signal and detecting a second heterodyne signal generated from the second part of the inspection part and the reference signal, and a processor 214 deciding an optical characteristic specific to the port in the multi-port optical device from one of the first and second heterodyne signals. |
