发明名称 TEST PROGRAM GENERATION DEVICE AND TEST PROGRAM GENERATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a test program generation device and a test program generation method capable of inputting a parameter corresponding to a template of the test program. SOLUTION: This device is an improved test program generation device for generating the test program from the template of the test program. The device is characterized by having a data item extraction means for extracting data items from the template, a parameter input means for displaying the data items of the data item extraction means, and inputting the parameter of the data items, and a program generating means for generating the test program with the parameter from the parameter input means and with the template.
申请公布号 JP2002148317(A) 申请公布日期 2002.05.22
申请号 JP20000338803 申请日期 2000.11.07
申请人 YOKOGAWA ELECTRIC CORP 发明人 TAKAMASU KOICHI;TOYONAGA KIYOMI
分类号 G01R31/3183;G01R31/28;(IPC1-7):G01R31/318 主分类号 G01R31/3183
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