发明名称 APPARATUS AND METHOD FOR X-RAY ANALYSIS
摘要 <p>PROBLEM TO BE SOLVED: To provide a fluorescent X-ray analyzer which can measure a trace element over a wide range and which is low-cost and compact and to provide a fluorescent X-ray analytical method. SOLUTION: The fluorescent X-ray analyzer is related to a fluorescent X-ray analyzer which performs the elemental analysis of a sample. An X-ray radiation device 1 which is provided with a first target composed of a first element and a second target composed of a second element different from the first element is installed. A selection means 6 which selects one target from among the targets and which can radiate primary X-rays 30 from the selected target toward a spectral element 10 is installed. A drive unit 7 by which the reflection face 13 of the spectral element 10 and the device 1 are turned at an angle ratio of 1:2 around a point O on the reflection face 13 of the spectral element 10 is installed.</p>
申请公布号 JP2002148225(A) 申请公布日期 2002.05.22
申请号 JP20000346198 申请日期 2000.11.14
申请人 TANIGUCHI KAZUO 发明人 TANIGUCHI KAZUO
分类号 G01N23/223;G01N23/207;(IPC1-7):G01N23/223 主分类号 G01N23/223
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