发明名称 DEVICE TEMPERATURE CHARACTERISTIC MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a small-sized device temperature characteristic measuring device capable of measuring precisely the device surface temperature in a bath, while the inside of the thermostatic bath is kept at a prescribed temperature accurately, quickly and stably with low power consumption, and imaging the device from an optional angle with high visibility. SOLUTION: In this device, the small-sized thermostatic bath 1 for holding the device 2 is its inside is made of silicon which is an infrared-ray transmissive raw material, and an infrared-ray illumination 10 for irradiating the device 2 in the bath 1 and a measuring probe 8 for executing temperature measurement thereof as objects with an infrared ray and an infrared camera 9 for imaging a reflected image are arranged oppositely outside the bath 1, and a temperature control part 7 executes temperature control of a heat exchanger 3 according to the temperature detection result of a temperature sensor 4 mounted in a metal plate 5 on the bottom of the bath 1 and the target setting temperature of a device temperature command part 6, to thereby keep the inside of the bath 1 at a prescribed uniform temperature, and the detection result of the relative position by a position detection part 13 is reflected to a measuring probe driving part 14 and an illumination control part 16 from image processed data of an image signal by the camera 9.
申请公布号 JP2002148304(A) 申请公布日期 2002.05.22
申请号 JP20000344743 申请日期 2000.11.13
申请人 NEC CORP 发明人 DOUKAWA YOSHIHIRO
分类号 G01R31/26;G01J5/10;G01J5/48;(IPC1-7):G01R31/26 主分类号 G01R31/26
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