| 摘要 |
PROBLEM TO BE SOLVED: To enable an X-ray diffractometer to be applied to large-size samples even when the apparatus is a general purpose apparatus. SOLUTION: Even the general purpose apparatus can be applied to large-size samples by switching the apparatus to be for general purpose or for large-size samples by a mounting means for mounting an X-ray source and a detector, or a sample stage. The X-ray diffractometer 1 is provided with the mounting means 14 for mounting the sample stage 4 to a horizontal goniometer 5, or the mounting means 12, 13 and 14 for mounting the X-ray source 2, the detector 3 and the sample stage 4 to the horizontal goniometer 5. Each mounting means can change a mounting position of the sample stage from the horizontal goniometer, or mounting positions of the sample stage, the X-ray source and the detector from the horizontal goniometer, and therefore large-size samples are set to and analyzed by even the general-purpose apparatus.
|
