发明名称 Over-current detecting circuit
摘要 An over-current detecting circuit (OCD Circuit) for comparing a voltage drop by an ON-state resistance of an output transistor with a reference voltage, to detect an over-current state of the output transistor. This OCD Circuit is provided with a first power source and an RVG Circuit, which outputs a first reference voltage on the basis of a voltage supplied from the first power source. The OCD Circuit is also provided with a constant-current source which generates a constant current having a second temperature characteristic on the basis of the first reference voltage, and a current mirror circuit which inputs the constant current. Moreover, the OCD Circuit is provided with a current-voltage converting circuit, which converts an output current from the current mirror circuit, to a voltage and outputs a reference voltage which has a temperature characteristic in proportion to the second temperature characteristic. A first temperature characteristic of the output transistor is compensated by the temperature characteristic of the reference voltage.
申请公布号 US6392392(B1) 申请公布日期 2002.05.21
申请号 US20000514383 申请日期 2000.02.28
申请人 NEC CORPORATION 发明人 NAKAHARA AKIHIRO
分类号 H03K17/08;G05F3/04;G05F3/08;G05F3/16;H03K17/14;(IPC1-7):G05F3/04 主分类号 H03K17/08
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