Method and device for managing an electronic component with complementary MOS transistors functioning under radiation

摘要

A method and device for managing the functioning under irradiation of an electronic component having a nominal supply voltage. During a test phase there is applied to the component an initial supply voltage less than the nominal voltage and the functioning of the component is checked. Next, during a working phase, the nominal supply voltage is applied to the component, and finally, during an off-load phase, an off-load voltage is applied to the component in order to determine whether the electronic component functions under irradiation.