发明名称 Method of fabricating a non-SOI device on an SOI starting wafer and thinning the same
摘要 A method of thinning a non-SOI device using an SOI thinning process that includes the steps of receiving an SOI starting wafer, where the SOI starting wafer includes a silicon substrate and an oxide layer thereon; selecting a non-SOI fabrication process for fabricating the non-SOI device; forming a layer of device quality silicon on the oxide layer of the SOI starting wafer to a sufficient thickness and doping profile to realize the non-SOI device; fabricating the non-SOI device in the device quality silicon layer using the non-SOI fabrication process selected; forming a support layer on the device quality silicon layer having the non-SOI device fabricated therein; and thinning the result of the last step using the SOI thinning process.
申请公布号 US6391744(B1) 申请公布日期 2002.05.21
申请号 US19970820200 申请日期 1997.03.19
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE NATIONAL SECURITY AGENCY 发明人 HUDAK JOHN J.;NEAL THOMAS R.;KARULKAR PRAMOD CHINTAMAN
分类号 H01L21/762;(IPC1-7):H01L21/46;H01L21/30 主分类号 H01L21/762
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