发明名称 Sample table for pattern exposure machine
摘要 A sample table for use in a pattern exposure machine configured to transfer a circuit pattern formed in a mask onto a sample. The sample table is divided into a center part and a peripheral part surrounding the center part. The center part and the peripheral part include a chuck mechanism for attracting the sample, respectively. A portion or the whole of the peripheral part are movable in a radial direction of the sample table in a condition that the sample is attracted to the peripheral part of the sample table. Thus, the invention operates such that when the pattern on the sample has become smaller or larger than a mask pattern, the sample, such as a silicon substrate, is expanded or contracted for a shortened time to obtain a desired.
申请公布号 US6392240(B1) 申请公布日期 2002.05.21
申请号 US19990262866 申请日期 1999.03.05
申请人 NEC CORPORATION 发明人 AIZAKI NAOAKI
分类号 H01L21/683;G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01J21/00 主分类号 H01L21/683
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