发明名称 Method of making an integrated circuit interconnect
摘要 A method of encapsulating metal lines (130, 132, 134, 136, 138) by implantation of dopants to form surface regions (131, 133, 135, 137, 139) after the metal lines have been fabricated. The surface regions may act as passivation layers and electromigration inhibitors and so forth.
申请公布号 US6391754(B1) 申请公布日期 2002.05.21
申请号 US19960722904 申请日期 1996.09.27
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 PARANJPE AJIT P.
分类号 H01L21/3215;H01L21/768;(IPC1-7):H01L21/320 主分类号 H01L21/3215
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