发明名称 Method of fabricating local interconnect
摘要 A method of forming a local interconnect is provided. A semiconductor is provided. An isolation structure, a transistor and a conductive layer are formed on the substrate. A dielectric layer with an opening is formed over the substrate. A part of the dielectric layer is removed by a photolithography and etching process to form a via opening to expose a part of the gate of the transistor or a part of the conductive layer. A conformal barrier layer is formed in the via opening and overflows the dielectric layer. A conductive plug is formed in the via opening. The barrier layer is patterned to form a local interconnect.
申请公布号 US6391760(B1) 申请公布日期 2002.05.21
申请号 US19980208734 申请日期 1998.12.08
申请人 UNITED MICROELECTRONICS CORP. 发明人 HSUE C. C.;CHEN WEI-CHUNG
分类号 H01L21/4763;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/4763
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