发明名称 Heating apparatus for bump bonding, bump bonding method and bump forming apparatus, and semiconductor wafer
摘要 An object of the present invention is to provide a bump-bonding heating apparatus, a bump bonding method and a bump forming apparatus which do not involve large-sized apparatus configuration and which are easy to handle, and a semiconductor wafer in which bumps are formed by using the bump bonding method. The bump-bonding heating apparatus has a wafer turning member, a turning unit and a wafer heating unit. The turning member is turned by the turning unit without turning the wafer heating unit, whereby a semiconductor wafer mounted on the turning member is turned. Like this, since the wafer heating unit is not turned, the apparatus configuration can be made compact. Since the turning member is turned directly by the turning unit, the turning angle of the semiconductor wafer can be implemented with higher precision as compared with the conventional gas floating type turning method.
申请公布号 US6392202(B2) 申请公布日期 2002.05.21
申请号 US20010955110 申请日期 2001.09.19
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NARITA SHORIKI;IMANISHI MAKOTO;MAE TAKAHARU;WATANABE NOBUHISA;KANAYAMA SHINJI
分类号 H01L21/60;H01L21/00;H01L21/68;(IPC1-7):F27B5/06 主分类号 H01L21/60
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