| 摘要 |
The invention relates to a device for the targeted displacement of electronic components, comprising a manipulation device (2) and a contact device (8), in addition to a device (12) for reflecting sonic or light waves, which can be inserted into the optical axis (11) between the manipulation device (2) and the contact device (8) and/or can pivot translationally or rotationally about a rotational axis (9) on the side of the contact device and a rotational axis (10) on the side of the manipulation device, or can pivot about a central rotational axis (24). Said reflection device (12) depicts the contact side (4) of the electronic component (3) to be inspected, the contact side (6) of the contact device (8) and/or the side of the manipulation device (2) facing the contact device (8), either completely or partially towards one or more measuring devices (5) provided outside the optical axis (11). The fixed or adjustable orientation and alignment of the measuring device (5) can be varied to a great extent, whilst maintaining the functional capability in the x and/or y and/or z direction. |
