发明名称 Methods of sensing temperature of an electronic device workpiece and methods of semiconductor processing
摘要 The present invention includes electronic device workpieces, methods of semiconductor processing and methods of sensing temperature of an electronic device workpiece. In one aspect, the invention provides an electronic device workpiece including: a substrate having a surface; a temperature sensing device borne by the substrate; and an electrical interconnect formed upon the surface of the substrate, the electrical interconnect being electrically coupled with the temperature sensing device. In another aspect, a method of sensing temperature of an electronic device workpiece includes: providing an electronic device workpiece; supporting a temperature sensing device using the electronic device workpiece; providing an electrical interconnect upon a surface of the electronic device workpiece; electrically coupling the electrical interconnect with the temperature sensing device; and sensing temperature of the electronic device workpiece using the temperature sensing device.
申请公布号 US6391663(B1) 申请公布日期 2002.05.21
申请号 US19990389924 申请日期 1999.09.03
申请人 MICRON TECHNOLOGY, INC. 发明人 AKRAM SALMAN;HEMBREE DAVID R.
分类号 G01K1/02;H01L21/66;(IPC1-7):H01C21/66 主分类号 G01K1/02
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