发明名称 Integrated circuit inductor structure and non-destructive etch depth measurement
摘要 A method for forming an electrical device structure in an integrated circuit comprises providing a substrate; forming a passivation layer thereon; forming a plurality of through holes in the passivation layer, the through holes; removing substrate material under the passivation layer by means of isotropic etching, thus forming at least a first cavity in the substrate beneath the plurality of through holes; forming a dielectric layer on top of the passivation layer to plug the through holes, thereby creating a membrane; and creating an electrical device, such as e.g. an inductor, above the membrane.
申请公布号 AU1292002(A) 申请公布日期 2002.05.21
申请号 AU20020012920 申请日期 2001.11.05
申请人 TELEFONAKTIEBOLAGET LM ERICSSON 发明人 TED JOHANSSON;HANS NORSTROM;CARL BJORMANDER
分类号 H01F17/00;H01F41/04;H01L23/522;H01L27/08 主分类号 H01F17/00
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