发明名称 |
MANUFACTURING METHOD OF THIN-FILM TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To obtain a thin-film transistor having improved performance and reliability by forming a high-quality gate insulating film and high-quality amorphous silicon without deteriorating the throughput. SOLUTION: Lamp light 50 is used, an insulating film 30 or a gate electrode 20 is selectively heated to form the insulating film 30, and an amorphous silicon film 70 is continuously formed, thus forming a high-quality insulating film and amorphous silicon film while the temperature in a substrate 10 is kept low, and hence obtaining the thin-film transistor having excellent reliability and performance without deteriorating the throughput.
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申请公布号 |
JP2002141508(A) |
申请公布日期 |
2002.05.17 |
申请号 |
JP20000334206 |
申请日期 |
2000.11.01 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MORITA YUKIHIRO;NISHITANI MIKIHIKO |
分类号 |
H01L21/205;H01L21/31;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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