发明名称 MANUFACTURING METHOD OF THIN-FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To obtain a thin-film transistor having improved performance and reliability by forming a high-quality gate insulating film and high-quality amorphous silicon without deteriorating the throughput. SOLUTION: Lamp light 50 is used, an insulating film 30 or a gate electrode 20 is selectively heated to form the insulating film 30, and an amorphous silicon film 70 is continuously formed, thus forming a high-quality insulating film and amorphous silicon film while the temperature in a substrate 10 is kept low, and hence obtaining the thin-film transistor having excellent reliability and performance without deteriorating the throughput.
申请公布号 JP2002141508(A) 申请公布日期 2002.05.17
申请号 JP20000334206 申请日期 2000.11.01
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MORITA YUKIHIRO;NISHITANI MIKIHIKO
分类号 H01L21/205;H01L21/31;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/205
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