发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a very precise and reliable trench having a gentle tapered face near an opening. SOLUTION: A process of forming the trench in the surface of a semiconductor substrate comprises: a first etching process of selectively etching the surface of the semiconductor substrate exposed out of a mask using a mixed gas of hydrohalogen and fluorocarbon; a second etching process of etching the surface of the semiconductor substrate using a plasma of a mixed gas of a halogen- contained gas and oxygen or nitrogen after the first etching process; and a third etching process of etching the surface of the semiconductor substrate using a plasma of a mixed gas of a halogen-contained gas and oxygen after the second etching process.
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申请公布号 |
JP2002141407(A) |
申请公布日期 |
2002.05.17 |
申请号 |
JP20000333274 |
申请日期 |
2000.10.31 |
申请人 |
ROHM CO LTD |
发明人 |
TAWARA TAKASHI |
分类号 |
H01L21/302;H01L21/3065;H01L21/336;H01L21/76;H01L21/822;H01L27/04;H01L29/78;(IPC1-7):H01L21/76;H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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