发明名称 ION OPTICAL SYSTEM FOR TOF MASS SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To provide an extraction lens for an ion source of TOF mass spectrometer which is easy to maintain and clean up. SOLUTION: The extraction lens includes an element with an opening, and the opening extends through the element so as to form a penetration channel through which, ion can pass through from one side to another side of the element by passing through the penetration channel when used. The length of the penetration channel is longer than the diameter of the opening by 8/10 times or more. By the above, the extraction lens with improves the ion extraction and the spatial focusing, is provided.
申请公布号 JP2002141016(A) 申请公布日期 2002.05.17
申请号 JP20010268393 申请日期 2001.09.05
申请人 KRATOS ANALYTICAL LTD 发明人 BOWDLER ANDREW R;RAPTAKIS EMMANUEL
分类号 G01N27/62;H01J49/06;H01J49/10;H01J49/40;(IPC1-7):H01J49/06 主分类号 G01N27/62
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