发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device at a low cost by realizing a further low temperature process (350 deg.C or lower or preferably 300 deg.C or lower). SOLUTION: A method for manufacturing the semiconductor device comprises the steps of forming a semiconductor layer 103 having a crystal structure, then simultaneously adding a p-type impurity element and a hydrogen element to a part of the layer 103 having a crystalline by using an ion doping method to form an impurity region 107 (a region having an amorphous structure), then heat treating at 100 to 300 deg.C to form a low resistance and amorphous impurity region 108, as a source region or a drain region of a TFT as the amorphous region as it is.</p>
申请公布号 JP2002141359(A) 申请公布日期 2002.05.17
申请号 JP20010245939 申请日期 2001.08.14
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ISOBE ATSUO;TAKAYAMA TORU;ARAO TATSUYA
分类号 G02F1/1368;G09F9/30;H01L21/265;H01L21/336;H01L27/32;H01L29/786;(IPC1-7):H01L21/336;G02F1/136 主分类号 G02F1/1368
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