发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device at a low cost by realizing a further low temperature process (350 deg.C or lower or preferably 300 deg.C or lower). SOLUTION: A method for manufacturing the semiconductor device comprises the steps of forming a semiconductor layer 103 having a crystal structure, then simultaneously adding a p-type impurity element and a hydrogen element to a part of the layer 103 having a crystalline by using an ion doping method to form an impurity region 107 (a region having an amorphous structure), then heat treating at 100 to 300 deg.C to form a low resistance and amorphous impurity region 108, as a source region or a drain region of a TFT as the amorphous region as it is.</p> |
申请公布号 |
JP2002141359(A) |
申请公布日期 |
2002.05.17 |
申请号 |
JP20010245939 |
申请日期 |
2001.08.14 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ISOBE ATSUO;TAKAYAMA TORU;ARAO TATSUYA |
分类号 |
G02F1/1368;G09F9/30;H01L21/265;H01L21/336;H01L27/32;H01L29/786;(IPC1-7):H01L21/336;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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