发明名称 PATTERN FORMING METHOD, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE AND PHOTOSENSITIVE COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a negative type pattern free of swelling and excellent in resolution while having a chemical structure transparent in the far UV region including 193 nm wavelength of ArF excimer laser beam and having high dry etching resistance. SOLUTION: A reaction in which part or the whole of a γ- or δ- acetoxycarboxylic acid structure is converted into a lactone structure by an acid catalyzed reaction is used.
申请公布号 JP2002139834(A) 申请公布日期 2002.05.17
申请号 JP20000340380 申请日期 2000.11.02
申请人 HITACHI LTD 发明人 HATTORI KOJI;YOKOYAMA YOSHIYUKI;SHIRAISHI HIROSHI
分类号 G03F7/038;C08F8/16;C08F32/04;C08K5/00;C08L45/00;G03F7/38;G03F7/40;H01L21/027 主分类号 G03F7/038
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