发明名称 |
PATTERN FORMING METHOD, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE AND PHOTOSENSITIVE COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming a negative type pattern free of swelling and excellent in resolution while having a chemical structure transparent in the far UV region including 193 nm wavelength of ArF excimer laser beam and having high dry etching resistance. SOLUTION: A reaction in which part or the whole of a γ- or δ- acetoxycarboxylic acid structure is converted into a lactone structure by an acid catalyzed reaction is used. |
申请公布号 |
JP2002139834(A) |
申请公布日期 |
2002.05.17 |
申请号 |
JP20000340380 |
申请日期 |
2000.11.02 |
申请人 |
HITACHI LTD |
发明人 |
HATTORI KOJI;YOKOYAMA YOSHIYUKI;SHIRAISHI HIROSHI |
分类号 |
G03F7/038;C08F8/16;C08F32/04;C08K5/00;C08L45/00;G03F7/38;G03F7/40;H01L21/027 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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