发明名称 |
Cleaning semiconductor wafers after mechanical processing comprises cleaning wafers with tenside solution, rinsing with water and drying |
摘要 |
Cleaning semiconductor wafers after mechanical processing comprises cleaning the wafers with a tenside solution; rinsing with water; and drying. Preferred Features: The tenside solution is an alkaline tenside solution, preferably containing sodium hydroxide or potassium hydroxide, or an aqueous solution, preferably an anionic tenside. The wafers are dried by gassing wit ozone.
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申请公布号 |
DE10150163(A1) |
申请公布日期 |
2002.05.16 |
申请号 |
DE20011050163 |
申请日期 |
2001.10.11 |
申请人 |
WACKER SILTRONIC GESELLSCHAFT FUER HALBLEITERMATERIALIEN AG |
发明人 |
SCHWAB, GUENTER;ESCHENFELDER, DAGMAR;LANGSDORF, KARLHEINZ |
分类号 |
C11D3/02;C11D11/00;H01L21/306;(IPC1-7):H01L21/302 |
主分类号 |
C11D3/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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