发明名称 Semiconductor memory device and storage method thereof
摘要 For a verify operation using potential Vbi', the data of a memory cell is preliminarily read by using potential Vai+1 and the state of the memory cell is stored in a latch circuit. Then, a verify/read operation is conducted by using potential Vbi'. If the state of the cell is higher than Ai+1, the outcome of the verify/read operation is forcibly brought down to a low level. Thus, only two latch circuits are required for storing an n-bit data, including one for storing the data to be written and one for preliminarily reading if the state of the cell is higher than Ai+1 or not and storing the outcome of the preliminary reading.
申请公布号 US2002057596(A1) 申请公布日期 2002.05.16
申请号 US20010034515 申请日期 2001.12.27
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SHIBATA NOBORU;TANAKA TOMOHARU
分类号 G11C16/02;G11C7/00;G11C11/56;G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C11/34 主分类号 G11C16/02
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