发明名称 Method and apparatus for detecting abnormal pattern candidates
摘要 Processing, in which a first shape-dependent filter in accordance with a shape of a microcalcification pattern is utilized, is performed on an object image, and a fine structure image, which illustrates a fine structure area embedded in the object image, is formed. Thereafter, enhancement processing, in which a second shape-dependent filter in accordance with the shape of a microcalcification pattern is utilized, is performed on the fine structure image, and an enhancement-processed image, in which the microcalcification pattern has been enhanced, is formed. A microcalcification pattern candidate is then detected by use of the enhancement-processed image.
申请公布号 US2002057826(A1) 申请公布日期 2002.05.16
申请号 US20010961208 申请日期 2001.09.24
申请人 FUJI PHOTO FILM CO., LTD. 发明人 IMAMURA TAKASHI;TAKEO HIDEYA
分类号 A61B6/00;G06T1/00;G06T5/00;G06T5/20;G06T7/00;(IPC1-7):G06K9/00 主分类号 A61B6/00
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