发明名称 EQUIPMENT FOR DEPOSITING THIN FILM OF SEMICONDUCTOR WAFER
摘要 PURPOSE: Equipment for depositing a thin film of a semiconductor wafer is provided to minimize generation of particles caused by variation of an inner temperature when a semiconductor wafer is induced to a process chamber, by preheating the semiconductor wafer of a room temperature in a process for aligning a flat zone before the semiconductor wafer is loaded to the process chamber of a high temperature. CONSTITUTION: A thin film is deposited on the semiconductor wafer(10) at a high temperature in the first chamber. A preheating unit preheats the semiconductor wafer before the semiconductor wafer is loaded to the first chamber. The second chamber aligns the flat zone of the semiconductor wafer before the semiconductor wafer is loaded to the first chamber.
申请公布号 KR20020036028(A) 申请公布日期 2002.05.16
申请号 KR20000065879 申请日期 2000.11.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAEK, SEON GYEONG
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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