发明名称 DESIRED WAVE/INTERFERENCE POWER RATIO MEASURING CIRCUIT AND DESIRED WAVE/INTERFERENCE POWER RATIO MEASURING METHOD
摘要 <p>The interference component included in the power of a desired wave is eliminated by subtracting the product of a first correction factor determined from a predetermined SIR characteristic diagram multiplied by the interference power from the desired wave power so as to correct the bias error in the low SIR region. The desired wave component included in the power of an interference wave is eliminated by subtracting the product of a second correction factor determined from the predetermined SIR characteristic diagram multiplied by the desired wave power from the interference power so as to correct the bias error in the high SIR region.</p>
申请公布号 WO2002039626(P1) 申请公布日期 2002.05.16
申请号 JP2001009817 申请日期 2001.11.09
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址