MODULE RAM TEST HANDLER

摘要

PURPOSE: A module RAM test handler is provided to perform room, high, and low temperature tests for a module RAM and an exothermic compensation by forming a circumstance of an ultra lower temperature state in a handler itself. CONSTITUTION: A loading portion(1) mounts a plurality of module RAMs(M) on a testing carrier(C). A preheating chamber(2) sequentially the carrier(C) to a conveyor and heats or cools the plurality of module RAMs(M) mounted on a testing carrier(C) to a predetermined temperature. A test chamber(3) mounts the module RAMs(M) at a test socket(7) and tests them under a predetermined temperature. A defrosting chamber provides cool air or heat in an opposite state to the tested carrier(C) to cool or heat the module RAMs(M) so that the module RAMs(M) becomes in an original room temperature status. An unloading portion(5) separates the tested module RAMs(M) from the carrier(C) conveyed from the defrosting chamber and loads them a tray designated according to a test result.