发明名称 Solid-state imaging device manufacturing method incorporates electrical imaging testing function
摘要 The manufacturing method has a solid-state imaging element (9) and an optical housing mounted on a flexible printed circuit board (31), which is provided with electrical imaging testing contact terminals (33), e.g. along one circuit board edge, which are removed at the end of the testing procedure. An Independent claim for a flexible printed circuit board for a solid-state imaging device is also included.
申请公布号 DE10132235(A1) 申请公布日期 2002.05.16
申请号 DE2001132235 申请日期 2001.07.04
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO 发明人 SHINOMIYA, KOHJI;ODA, YUKIO
分类号 H01L27/14;H01L27/146;H04N5/225;H04N5/335;H04N5/369;H04N17/00;H05K1/02;H05K1/18;(IPC1-7):H01L27/146;H01L21/66 主分类号 H01L27/14
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