发明名称 TRENCH ISOLATION LAYER AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A trench isolation layer and a method for manufacturing the same are provided to prevent a focusing of electric field from the corner of an isolation layer by rounding the corner. CONSTITUTION: A first oxide(120b) is filled into a trench(116) of a semiconductor substrate(104). The first oxide(120b) is surrounded by a buffer layer(118a). A thermal oxide(114a) is formed at both corner of the trench(116) and adjacent to the buffer layer. The interface between the thermal oxide(114a) and the semiconductor substrate(104) has a rounding shape. Preferably, the semiconductor substrate(104) has an SOI(Silicon On Insulator) structure stacked sequentially a silicon substrate(100), a buried oxide(101) and a silicon layer(102).
申请公布号 KR20020036298(A) 申请公布日期 2002.05.16
申请号 KR20000066433 申请日期 2000.11.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, MIN;PARK, SEON HU
分类号 H01L21/308;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/308
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