发明名称 |
TRENCH ISOLATION LAYER AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A trench isolation layer and a method for manufacturing the same are provided to prevent a focusing of electric field from the corner of an isolation layer by rounding the corner. CONSTITUTION: A first oxide(120b) is filled into a trench(116) of a semiconductor substrate(104). The first oxide(120b) is surrounded by a buffer layer(118a). A thermal oxide(114a) is formed at both corner of the trench(116) and adjacent to the buffer layer. The interface between the thermal oxide(114a) and the semiconductor substrate(104) has a rounding shape. Preferably, the semiconductor substrate(104) has an SOI(Silicon On Insulator) structure stacked sequentially a silicon substrate(100), a buried oxide(101) and a silicon layer(102).
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申请公布号 |
KR20020036298(A) |
申请公布日期 |
2002.05.16 |
申请号 |
KR20000066433 |
申请日期 |
2000.11.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, MIN;PARK, SEON HU |
分类号 |
H01L21/308;H01L21/762;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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