发明名称 DATA SENSING DEVICE OF SEMICONDUCTOR MEMORY
摘要 PURPOSE: A data sensing device of a semiconductor memory is provided, which performs a reliable data sensing operation useful to a large integrated DRAM without using an additional signal for a precharge and an equalization in the DRAM, and reduces a mutual capacitance( or coupling capacitance) between bit line pairs in the DRAM. CONSTITUTION: A precharge/equalizer circuit(10) comprising serially connected NMOS transistors(M5,M6) is connected between bit line pairs(BLi,BLBi) of the ith block. And a precharge/equalizer circuit(20) comprising serially connected NMOS transistors(M7,M8) is connected between bit line pairs(BLj,BLBj) of the ith block. An isolation transistor(M1) is connected between the bit line(BLi) and a sensing node(SN), and an isolation transistor(M3) is connected between the sensing node and the jth bit line(BLj). An isolation transistor(M2) is connected between the bit line(BLBi) and a sensing node(SNB), and an isolation transistor(M4) is connected between the sensing node and the bit line(BJBj).
申请公布号 KR20020036562(A) 申请公布日期 2002.05.16
申请号 KR20000066805 申请日期 2000.11.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SIM, JAE YUN
分类号 G11C11/409;G11C7/06;G11C7/18;G11C11/401;G11C11/4091;G11C11/4097;H01L21/8242;H01L27/108;(IPC1-7):G11C11/409 主分类号 G11C11/409
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