发明名称 Separation process for silicon-on-insulator wafer fabrication
摘要 A process for manufacturing a silicon-on-insulator wafer from a silicon wafer assembly. The assembly is made of two wafers. One of the wafers contains a fragile layer. The fragile layer is a layer containing a high amount of hydrogen. An amount of energy from an energy source is applied to the assembly to separate the assembly along the fragile layer thus forming a silicon-on-insulator wafer and a leftover wafer. The energy source is selected from the group consisting of: ultrasound, infrared, hydrostatic pressure, hydrodynamic pressure, or mechanical energy. The amount of energy is chosen to be sufficient to transform the fragile layer into a quasi-continuous gaseous layer. Under separation the hydrogen-enriched layer transforms into layer consisting of hydrogen platelets and hydrogen microbubbles.
申请公布号 US6387829(B1) 申请公布日期 2002.05.14
申请号 US20000543998 申请日期 2000.04.06
申请人 SILICON WAFER TECHNOLOGIES, INC. 发明人 USENKO ALEXANDER YURI;CARR WILLIAM NED
分类号 H01L21/20;H01L21/762;(IPC1-7):H01L21/425;H01L21/265 主分类号 H01L21/20
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