发明名称 |
Method of forming an on-chip decoupling capacitor with bottom hardmask |
摘要 |
An on-chip vertically stacked decoupling capacitor includes a hardmask film formed between the capacitor dielectric and the lower electrode. The manufacturing process used to form the capacitor takes advantage of the hardmask film and enables the capacitor to be formed over a low-k dielectric material. Attack of the underlying low-k dielectric material is suppressed during the etching and stripping processes used to form the capacitor, due to the presence of the hardmask. The low-k dielectric film provides for a reduced parasitic capacitance between adjacent conductive wires formed in the low-k dielectric material and therefore provides for increased levels of integration.
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申请公布号 |
US6387754(B2) |
申请公布日期 |
2002.05.14 |
申请号 |
US20010887381 |
申请日期 |
2001.06.22 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION;INFINEON TECHNOLOGIES NORTH AMERICA CORP. |
发明人 |
DALTON TIMOTHY J.;COWLEY ANDREW P.;EMMI PETER A.;KALTALIOGLU ERDEM;MCGAHAY VINCENT J. |
分类号 |
H01L21/02;H01L21/3213;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/02 |
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