发明名称 Method for manufacturing an integrated circuit with low threshold voltage differences of the transistors therein
摘要 In an integrated circuit with low threshold voltage differences of the transistors and a manufacturing process for such an integrated circuit, MOS transistors of different lengths but having threshold voltages that are substantially the same are made by avoiding dopant peaks at the channel edges by an angled nitrogen implantation, so that implantation paths at those edges are occupied by nitrogen atoms.
申请公布号 US6387766(B1) 申请公布日期 2002.05.14
申请号 US19990429834 申请日期 1999.10.29
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHUMANN DIRK
分类号 H01L21/265;H01L21/336;H01L21/8234;H01L27/088;H01L29/10;(IPC1-7):H01L21/336 主分类号 H01L21/265
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