发明名称 Thermal conductivity enhanced semiconductor structures and fabrication processes
摘要 Silicon is formed at selected locations on a substrate during fabrication of selected electronic components. A dielectric separation region is formed within the top silicon layer, and filled with a thermally conductive material. A liner material may be optionally deposited prior to depositing the thermally conductive material. In a second embodiment, a horizontal layer of thermally conductive material is also deposited in an oxide layer or bulk silicon layer below the top layer of silicon.
申请公布号 US6387742(B2) 申请公布日期 2002.05.14
申请号 US20010862451 申请日期 2001.05.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GAUTHIER, JR. ROBERT J.;SCHEPIS DOMINIC J.;TONTI WILLIAM R.;VOLDMAN STEVEN H.
分类号 H01L27/04;H01L21/762;H01L21/763;H01L21/822;H01L23/367;H01L27/00;H01L27/12;H01L29/786;(IPC1-7):H01L21/336;H01L21/823;H01L21/331;H01L21/76 主分类号 H01L27/04
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